（四川大學測試技術與控制工程系,四川 成都 610065)
中圖分類號：TM933.3+12， TN249 文獻標識碼：A
Measuring circuit design for high-frequency phase of laser profilometer
OU Wen-chu， XIE Chi
（Department of Testing Technology and Control Engineering，Sichuan University，Chengdu 610065，China）
Abstract: High-frequency phase measuring equipment is an indispensable part of the laser profilometer. Its work is to measure the phases of two measured signals. One measurement method using designed circuit to change high-frequency into low-frequency with the frequency mixing theory and phase locking technique, then using correlative counting method to measure low-frequency was introduced. The low-frequency part mainly used the ample resource of SCM and flexible functions of CPLD. With combination of frequency mixing circuit and low-frequency measurement circuit, the designed circuit can measure the phase more accurately.
Key words: Frequency mixing theory; Phase locking technique; SCM(single-chip computer); CPLD; Correlative counting method